BEGIN:VCALENDAR
PRODID:-//EventsEye//www.eventeye.com//EN
VERSION:2.0
METHOD:PUBLISH
BEGIN:VEVENT
DTSTART;VALUE=DATE:20090128
DTEND;VALUE=DATE:20090131
DTSTAMP:20081009T000000Z
LOCATION:Tokyo International Exhibition Center (Tokyo Big Sight) (Tokyo - Japan)
UID:2008-10-09:15:56:50@eventseye.com
URL:http://www.eventseye.com/fairs/expos/iCalendar/electrotest-japan-5853-1.ics
DESCRIPTION:ELECTROTEST JAPAN\n\nThe official website of this event:\nhttp://www.electrotest.jp/english\n\nThe EventsEye page of this event:\nhttp://www.eventseye.com/fairs/f-electrotest-japan-5853-1.html\n\nDescription:\nExhibition Featuring all Lines of Test, Inspection and Measurement Systems for SMT, IC Packaging and Board Manufacturing\n\nDate:\nJan. 28 - 30, 2009\nTokyo International Exhibition Center (Tokyo Big Sight) (Tokyo - Japan)\n
SUMMARY:ELECTROTEST JAPAN
CATEGORIES:Trade Show
CLASS:PUBLIC
BEGIN:VALARM
TRIGGER:-PT10080M
ACTION:DISPLAY
DESCRIPTION:Reminder
END:VALARM
END:VEVENT
END:VCALENDAR